Why this question matters now
We open with the modern reality: most “high-performance” SPR sensors are no longer just prism/metal/analyte. Once you add oxides, high-index films, and 2D overlayers, sensitivity can improve dramatically—but so can linewidth, drift, and fabrication sensitivity. This section frames the goal of the article: to explain what actually controls sensitivity in multilayer SPR, and why many “high sensitivity” claims fail in real readout conditions.
The minimum physics: SPR is a phase-matching problem

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We lay down the Kretschmann picture in a clean way: the resonance occurs when the in-plane momentum of the incident p-polarized light matches the real part of the SPP mode wavevector. We introduce the canonical relations (in MathJax form) that we’ll reuse later:
- $k_0 = \frac{2\pi}{\lambda}$
- $k_x = k_0 n_p \sin\theta$
- $k_{\mathrm{SPP}} = k_0 \sqrt{\frac{\varepsilon_m \varepsilon_d}{\varepsilon_m + \varepsilon_d}}$
- $k_0 n_p \sin\theta_{\mathrm{res}} = \Re!\left(k_{\mathrm{SPP}}\right)$
Then we explain what changes in multilayers: the “dielectric side” is no longer a single $\varepsilon_d$, but an effective optical environment that reshapes both the SPP dispersion and the mode profile.
What sensitivity really means (and why it is not enough)
We define angular sensitivity and immediately connect it to measurability:
- $S_\theta = \frac{\Delta\theta_{\mathrm{res}}}{\Delta n}$
We then introduce why linewidth matters: - $\mathrm{FOM} = \frac{S_\theta}{\mathrm{FWHM}}$
This section will set up the main theme: multilayers are powerful because they can increase $S_\theta$, but the best designs are the ones that also control $\mathrm{FWHM}$ and preserve a stable, trackable resonance minimum.
The three real controllers of sensitivity in multilayer SPR
This is the core conceptual section, written as a narrative with engineering intuition:
First, field overlap with the analyte: sensitivity rises when more of the resonant field energy samples the sensing region, but pushing the field outward can broaden the dip or reduce coupling depth.
Second, dispersion slope: multilayers can change how quickly the resonance condition shifts with analyte index, meaning you can gain sensitivity even without dramatically changing penetration depth.
Third, damping and leakage: intrinsic absorption, radiative leakage, and scattering set the resonance linewidth, and linewidth often dominates the practical detection limit even when $S_\theta$ looks impressive.
How multilayers “shape the mode”: what each layer is really doing
Instead of treating the stack as a checklist, this section reads like a guided tour through a multilayer design:
We explain how the prism primarily sets the available momentum range and where $\theta_{\mathrm{res}}$ sits.
We discuss the metal as the baseline loss engine and coupling gatekeeper, with thickness controlling under-coupling versus overdamping.
We describe thin oxides (e.g., TiO$_2$) as impedance transformers and leakage suppressors when used properly, and as linewidth killers when over-thick.
We explain high-index films (including chalcogenides) as mode shapers that can either increase analyte overlap or pull energy into the stack depending on thickness and loss.
We position 2D layers (graphene, BP, TMDCs) as surface-field enhancers that must be justified by net gains in FOM/LOD, not just by “more material = more sensitivity.”
The trade-offs that decide whether a high-sensitivity design is actually usable
Here we unpack common failure modes in multilayer optimization:
A design can raise $S_\theta$ while producing a broader dip, reducing $\mathrm{FOM}$ and worsening detection limit.
A deeper dip can still be hard to track if the resonance becomes hypersensitive to thickness errors, temperature drift, or roughness-induced scattering.
We also address the hidden truth: for many stacks, the win comes less from exotic materials and more from controlling radiative leakage and damping so the resonance becomes sharper and easier to measure.
A practical optimization workflow that engineers can reuse
We describe a realistic workflow that prioritizes measurable performance:
Start from a stable baseline and optimize metal thickness for a deep, narrow dip.
Add one coupling-control layer (often an oxide) and re-optimize for linewidth and resonance depth.
Add one mode-shaping layer (often high-index) and optimize for analyte overlap without trapping the field away from the sensing region.
Only then add functional/2D layers if they improve $\mathrm{FOM}$ or the detection limit, not merely $S_\theta$.
We end with a simple “performance triangle” mindset: report and optimize $S_\theta$, $\mathrm{FWHM}$, and LOD together.
Conclusion: the short, correct answer
We conclude that sensitivity in multilayer SPR is controlled at the stack level by how the design co-optimizes phase matching, analyte field overlap, and total damping. The forward-looking insight is that the next wave of SPR performance will come from tolerance-aware, loss-engineered stacks that remain sharp and stable in real devices—not only from adding more layers.
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